SPIRIT contributions
In this section you will find contributions from the SPIRIT consortium to conferences and workshops.
| The influence of additive elements on the growth of Ni silicide thin films studied in-situ Colloquium: iThemba LABS, Somerset West, South Africa Talk (2009) - |
| The SPIRIT project: Fast ions for everybody in Europe GDCh-Wissenschaftsforum Chemie Poster (2009) 30.08.-02.09.2009 |
| Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profiling 19th International Conference on Ion Beam Analysis Poster (2009) - |
| A new ion beam analysis data format 19th International Conference on Ion Beam Analysis Poster (2009) - |
| IBA with high resolution gas ionization detectors 19th International Conference on Ion Beam Analysis Inv. Talk (2009) - |
| Gas ionization chambers - principles and recent developments Course at Centro Nacional de Aceleradores (CNA), Sevilla, Spain, 10.-12.03.2009 - (2009) - |
| In situ, real-time RBS to study the redistribution of impurities during silicide formation 19th International Conference on Ion Beam Analysis Poster (2009) - |
| Real-time Rutherford backscattering spectrometry (RBS) study of the formation of Pt-germanides 19th International Conference on Ion Beam Analysis Poster (2009) - |
| Towards Atmospheric Pressure SIMS (AP-SIMS) 19th International Conference on Ion Beam Analysis Poster (2009) - |
| Towards Atmospheric Pressure SIMS (AP-SIMS) 17th International Conference on Secondary Ion Mass Spectrometry Poster (2009) - |
| Real-time ion beam analysis using artificial neural networks 19th International Conference on Ion Beam Analysis Inv. Talk (2009) - |
| Surface Analysis with High Energy Time-of-Flight Secondary Ion Mass Spectrometry Measured in Parallel with PIXE and RBS 19th International Conference on Ion Beam Analysis Talk (2009) - |
| Comparison of MeV monomer ion and Cluster SIMS 17th International Conference on Secondary Ion Mass Spectrometry Talk (2009) - |
| Release of light elements from ultra thin films during high resolution depth profiling using heavy ion ERDA 19th International Conference on Ion Beam Analysis, Cambridge, UK Poster (2009) - |
| Quantitative ion beam analysis of ultra thin films with magnetic spectrometers using heavy MeV ions 5th International Workshop on High-Resolution Depth Profiling, Kyoto, Japan Talk (2009) - |
| Ion Beam Analysis for the Identification of Heavy Metal-free Gunshot Residue Australian and New Zealand Forensic Science Society Symposium, Sydney, Australia Talk (2010) - |
| Schnelle Ionen für Europa - Das SPIRIT-Projekt Deutsche Tagung für Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräten (SNI2010) Poster (2010) 24.-26.02.2010 |
| The Use of Ion Beams for Depth-Profiling Fingerprints Science Engineering and Technology (SET) for Britain - Poster Presentation in the Physical Sciences Section (Chemistry), House of Commons, London, UK Poster (2010) - |
| PIXE and MeV Time-of-Flight Secondary Ion Mass Spectrometry Analysis of the Effects of Fingerprints on Silver 12th International Conference on Particle Induced X-Ray Emission and its Analytical Applications, Guildford, UK Poster (2010) - |
| Introduction Rate of Vacancy Related Defects Produced by Focused Ion Beams in n-type Silicon Studied by DLTS and IBIC 12th International Conference on Nuclear Microprobe Technology and Applications, Leipzig, Germany Inv. Talk (2010) - |
| scCVD Diamond Detector: Spectroscopic Performance and Radiation Hardness Tests 12th International Conference on Nuclear Microprobe Technology and Applications, Leipzig, Germany Poster (2010) - |
| Surface Analysis with High Energy Time-of-Flight Secondary Ion Mass Spectrometry Transfer Viva Presentation MPhil/PhD for the Faculty of Engineering and Physical Sciences, University of Surrey Talk (2010) - |
| Time-of-Flight Secondary Ion mass Spectrometry Using MeV Primary Ions Seminar at INFN Florence, Italy Inv. Talk (2010) - |
| Development of MeV SIMS analysis in air New detector technologies for advanced materials research using ion beam analysis, Plitvice Lakes, Croatia Talk (2010) - |
| Advanced Ion Beam Characterization and Processing of Thin Films 11th European Vacuum Conference, Salamanca, Spain Inv. Talk (2010) - |
| Radiation hard gas ionization detectors for IBA Conference on the Application of Accelerators in Research and Industry, Fort Worth, USA Inv. Talk (2010) - |
| Round Robin for the Measurement of the Ti/N Ratio in TiNx Thin Films in several European Laboratories European Conference on the Application of Accelerators in Research and Technology, ECAART, Athens, Greece Talk (2010) - |
| The Effects of Fingerprints on Silver Metals 2010: the triennial meeting of the Metals Working Group of the Conservation Committee of the International Council of Museums (Metals-WG-ICOM-CC) - (2010) - |
| Ion Beam Analysis for the Identification of Sintox® Gunshot Residue Royal Society of Chemistry Analytical Research Forum, Loughborough University, United Kingdom Poster (2010) - |
| On-line IBA analysis by Artificial Neural Networks Ion Beam Analysis Francophone 3e rencontre “Analyse pas faisceaux d’ions rapides”, Namen, Belgium Inv. Talk (2010) - |
| Artificial neural networks in accelerator based data analysis 21st International conference on the Application of Accelerators in Research and Industry (CAARI), Fort Worth, Texas, USA Inv. Talk (2010) - |
| Thin film studies by the application of complementary techniques in real time 37th International Conference on Metallurgical Coatings and Thin films (ICMCTF), San Diego, CA, USA Inv. Talk (2010) - |
| The Use of Ion Beams for Forensic Analysis 1st London and South East Regional Forensic Student Conference, University of Westminster, London, UK Talk (2010) - |
| Depth-Profiling of Fingerprints and Inks for Forensic Investigations UK Fingerprint Society Annual Conference, University College London, London, UK Talk (2010) - |
| The Use of Ion Beams for Depth-Profiling Fingerprints Royal Society of Chemistry Analytical Research Forum, Loughborough University, Loughborough, UK Talk (2010) - |
| Forensic Fingerprint Analysis using Particle Accelerators Australia and New Zealand Forensic Science Society Annual Symposium, Sydney, Australia Talk (2010) - |
| Surface erosion induced by heavy ion backscattering analysis European Conference on the Application of Accelerators in Research and Technology, ECAART, Athens Poster (2010) - |
| Fluence Control in several European Ion Implanters European Conference on the Application of Accelerators in Research and Technology, ECAART, Athens, Greece Poster (2010) - |
| Surface composition and morphology changes of JET tiles under plasma interactions 26th Symposium on Fusion Technology, Oporto, Portugal Poster (2010) - |
| Structural and optical studies of Au doped titanium oxide films Ion Beam Modification of Materials, Montreal, Canada Poster (2010) - |
| Functionalization of Silicon surfaces by ion implantation Ion Beam Modification of Materials, Montreal, Canada Poster (2010) - |
| Tungsten- micro diamond composites for plasma facing components European Materials Research Conference, Strasbourg, France Poster (2010) - |
| High depth resolution analysis of elemental depth distributions in nanocoatings 2nd International Conference on Functional Nanocoatings, Dresden, Germany Poster (2010) - |
| Hydrogen depth profiling with nanometre resolution 2nd International Conference on Functional Nanocoatings, Dresden, Germany Poster (2010) - |
| “Ions and X-rays: Unique partners for accurate stopping power determination of 15N ions in Si for hydrogen depth profiling” Deutsche Tagung für Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräten (SNI2010), Berlin, Germany Poster (2010) - |
| Ions and X-rays: Unique partners for accurate stopping power determination of 15N ions in Si for hydrogen depth profiling Deutsche Tagung für Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräten (SNI2010), Berlin, Germany Poster (2010) - |
| Ladungsabhängigkeit des Bremsvermögens und der Umladungsquerschitte von leichten MeV Schwerionen in ultradünnen DLC Kohlenstofffolien Deutsche Tagung für Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräten (SNI2010), Berlin, Germany Poster (2010) - |
| Gas ionization detectors for ERDA, RBS and STIM European workshop on New detector technologies for advanced materials research using ion beam analysis, Plitvice, Croatia Inv. Talk (2010) - |
| Light element analysis using elastic scattering coincidence technique at the Zagreb microprobe 10th European Conference on Accelerators in Applied Research and Technology (ECAART 10), Athens, Greece Inv. Talk (2010) - |
| Heavy Ion Microprobe of the Ruđer Bošković Institute 12th International Conference on Nuclear Microprobe Technology and Applications, Leipzig, Germany Talk (2010) - |
| Chemical effects on the K and K2,5 x-ray lines of 3d transition elements and their oxide compounds by PIXE European Conference on X-Ray Spectrometry, Coimbra, Portugal Talk (2010) - |
| Influence of Cr K- edge absorption on measured chemical effects in K X-ray spectra of Cr and its compounds induced by proton impact 12th International Conference on Particle Induced X-ray Emission and its Applications, Guildford, United Kingdom Talk (2010) - |
| Downsizing of crystal spectrometers for ion microbeam WDX-PIXE application 12th International Conference on Particle Induced X-ray Emission and its Applications, Guildford, United Kingdom Talk (2010) - |
| Quantitative Tiefenprofilelementanalyse mit Subnanometer Tiefenauflösung 6. Workshop RCA (Radiochemische Analytik bei Betrieb und Rückbau kerntechnischer Anlagen, der Deklaration von Abfällen und im Strahlenschutz) & 23. SAAGAS (Seminar Aktivierungsanalyse und Gammaspektroskopie), Forschungszentrum Dresden-Ross Talk (2010) - |
| Channeling as a means to obtain information on crystal quality and structure New detector technologies for advanced materials research using ion beam analysis, Plitvice Lakes, Croatia Talk (2010) - |
| A new mini gas ionization chamber for IBA applications 10th European Conference on Accelerators in Applied Research and Technology (ECAART 10) Talk (2010) - |
| In-air STIM with a capillary microprobe International Conference on Ion Beam Analysis IBA-20, Itapema, Brasil Talk (2011) - |
| Total IBA - Where Are We? 20th International Conference on Ion Beam Analysis, Brazil Inv. Talk (2011) - |
| MeV-SIMS measurements with focused copper primary ions on the Surrey Ion Beam Centre’s micro and external beam lines 20th International Conference on Ion Beam Analysis, Brazil Poster (2011) - |
| Towards ambient pressure SIMS using MeV monomer primary ions 23rd annual workshop on SIMS, Baltimore, MD, USA Poster (2011) - |
| Molecular Imaging using MeV SIMS SPIRIT midterm review and user meeting at Farnham Castle, UK Poster (2011) - |
| MeV Secondary ion Mass Spectrometry SPIRIT JRA meeting Paris, France Inv. Talk (2011) - |
| Forensic Science meets Material Science – Analysis of Fingerprints and Inks Institute of Minerals, Materials and Mining (IOM3) Young Persons’ Lecture Competition, London, UK Talk (2011) - |
| Comparison of Techniques for the Chemical Characterisation of Fingerprints UK Fingerprint Society Annual Conference, University of Wolverhampton, Telford, UK Talk (2011) - |
| Ion Beam Analysis in Forensics: The Use of ToF SIMS for the Chemical Characterisation of Fingerprints European Materials Research Society Spring Meeting, Nice, France Inv. Talk (2011) - |
| A novel detector for the measurement of microdosimetric spectra for protons and light ions Submitted to ESTRO Talk (2011) - |
