Training

Tutorials for young scientists (1 per year)

The tutorials covered the main areas of application : ion implatnation, ion beam surface analysis, biomedical applications and instrumental aspects. 

Surrey has held a training course for its early stage reserachers every two years and the course programme, together with the lecture notes from each of the modules can be found here

Technician Exchange Programme ( Surrey, Rossendorf, Paris and Lueven, 2010-2013)

Funding is no longer available for technicians to visit one of the larger TNA providers (SUR, HZDR, CEA and KUL) for training puposes. The aim of this programme was to share best practice on pracical and technical aspects of accelerator facilities.  For more information, contact Brian Jones (b.jones@surrey.ac.uk)

User Training at the TNA providers (ongoing)

Each TNA provider will provide training from experienced scientists and operators.  To see Surrey's training manual, click here. If you would like to share the manual from your own insitution, please contact the Network Facilitator, Brian Jones (b.jones@surrey.ac.uk)

Past Courses 

Gas Detector Workshop at ETHZ

A workshop was held at ETHZ from November 3 to November 12, 2009 with participants from RBI, KUL and ETHZ. The aim of the event was to teach the participants the basic functional principles, the constructional details, and the practical use of gas ionization counters. Before the workshop, a complete set of components of an annular gas ionization chamber had been prepared. During the workshop, the detector was then assembled from scratch with these prefabricated parts. Towards the end of the tutorial, the detector was connected to the NEC SDH1 accelerator and tested in direct beam with protons and oxygen ions. For the workshop a complete documentation of the gas detector including construction blueprints, detailed assembly instructions and an operating manual has been compiled and can be found under the following link:
http://www.ams.ethz.ch/research/projects/material_science/le-iba/GID_documentation

This kind of training worksop can be repeated with other participants, if required.

SPIRIT Networking and Leadership Course 14-18 June 2010, Surrey, UK

The SPIRIT Netwoking course took place from 1pm on Monday 14th June to 1pm on Friday 18th June.

This networking training week was designed to enable the postdoctoral fellows working on SPIRIT to conduct their reserach more effectively, to communicate their ideas and to facilitate dissemination of reserach.  The course will consist of short lectures followed by exercises to develop "learning through experience". The following skills were taught :

• brainstorming
• negotiations
• delegation
• carrying out work in parallel
• meeting deadlines

Tutorial 1 : ION IMPLANTATION AND IRRADIATION : 13-14 December 2010, Dresden, Germany

Participants of the tutorials in front of the HZDR

Tutorial programme

Slides of the presentations will be posted here, as they are available.

Tutorial 2: ION BEAM SURFACE ANALYSIS, 20/21 June 2011, Zurich, Switzerland

The second SPIRIT Tutorial “Ion Beam Surface Analysis” was held June 20/21 at ETH Zurich. 22 participants attended the course, 9 of which obtained financial support by SPIRIT and 5 came from SPIRIT partner institutions. On the first day, 7 lectures on the basic principles of Ion Beam Analysis were held by the ETHZ team. Then samples were prepared for the RBS/PIXE measurement planned for the following day. All participants and the ETHZ team spent the evening in downtown Zurich to stimulate social contact among the young people from 13 nations. In the morning of the second day, participants formed 4 groups and carried out RBS/PIXE experiments at the accelerator lab, partly on a collection of standard samples, partly on samples of their own research projects. The laboratory work alternated with a practical course in SRIM calculation. The RBS/PIXE data taken in the morning were then analysed by the participants in the afternoon with support of the local team. All attendees were strongly motivated by the challenge of solving the given tasks. Many of them even skipped the afternoon coffee break to finish their analysis. 

At the end of the tutorial, participants were asked to fill in detailed feedback forms, evaluating the quality of the tutorial administration and performance as well as the level and benefit of the lectures and the hands-on work. On the average the quality of the event was rated with 4.5 points in a range from 1 to 5 points. For a large majority of participants the level of the presented material was "just right". Of all aspects of the course the practical work was judged most positively.

This tutorial covered the basic principles of MeV ion beam analysis. Participants were introduced to RBS (Rutherford Backscattering Spectrometry), ERDA (Elastic Recoil Detection Analysis) and PIXE (Particle Induced X-ray Emission) for surface and thin layer analysis. It included hands-on laboratory practice and data analysis.

The tutorial targeted potential users of ion beam analysis techniques in a wide range of research disciplines and young students in ion beam physics. It was open to the European research community.

Programme

Tutorial 3: High Resolution Depth Profiling, 25/26 June 2011, Paris, France

The Tutorial was held over the weekend preceding the High Resolution Depth Profiling workshop HRDP6. The Tutorial attracted 27 participants from SPIRIT and other European labs, but also from Russia, the Ukraine, South Africa, Romania, and Japan. SPIRIT was able to offer travel and accommodation bursaries to 15 participants. The placing of the Tutorial immediately before HRDP meant that it was easy to attract high-level international experts already coming to HRDP6, to give lectures on high energy resolution ion beam production, high resolution electrostatic and magnetic detectors, and applications of MEIS and high resolution ERDA. The tutorial included a hands-on session on the SAFIR narrow resonance profiling system, with a two-hour experimental session for each of three groups of ten participants, and a communal 2 1/2 hour data interpretation session. The participants appreciated the chance to meet the high level experts, and were invited to the opening cocktails of HRDP6 where they appreciated the opportunity to meet many more experts in high resolution depth profiling. Some of the Tutorial participants stayed in for the HRDP6 Workshop.

HRDP6 was attended by 74 registered participants coming from North America, South America, Asia, and Europe. Twelve Invited Speakers introduced sessions in which 34 Oral presentations were made, and 24 Poster presentations were displayed for the duration of the Workshop. The Invited Speakers, being at the cutting edge of their respective fields, were offered one of a limited series of hand-made ‘Laguiole’ pockets knives in appreciation of their contributions. A special effort was made to showcase high resolution ion beam depth profiling techniques and applications, and at the same time a selection of new or complementary high resolution depth profiling techniques were presented. In particular, there was an Invited talk on the Atom Probe, and one on the use of surface diffraction of grazing incidence He beams for monitoring MBE layer-by-layer growth – a kind of ion beam analogue of RHEED. The latest developments in high depth resolution SIMS were also presented in an Invited talk. Participants were able to relax and ‘network’ during the outings organised in central Paris, and during the Gala Dinner, which was held on a Bateau Mouche dinner cruise along the Seine River.

This third Spirit Tutorial followed on rapidly from the second Spirit Tutorial held in Zurich 20/21 June 2011. Participants coming from a long distance could include the two tutorials in a single voyage. The tutorial also preceded HRDP6, the 6^th International Workshop on High Resolution Depth Profiling (this is the 2^nd SPIRIT Workshop).

The Tutorial, aimed at early career researchers and at established researchers wishing to learn more about high resolution depth profiling techniques, provided lectures on basic pulse height spectroscopy, narrow resonance profiling, high resolution magnetic and electrostatic detectors, surface structure determination with MEIS, high resolution standard RBS, and high resolution ERDA. A hands-on session involving a Narrow Resonance Profiling measurement with the SAFIR facility and analysis of the obtained data was given. 

Because the Tutorial immediately preceded HRDP6, a number of lectures were given by eminent scientists present in Paris for HRDP6, and participation in the Tutorial gave a good buildup for those wishing to extend their stay by participation in the scientific sessions of HRDP6. 

Programme

Saturday 25 June (Jussieu Campus)

9h30-11h00         Basic particle detection instrumentation (Alain L’Hoir, Paris) 

11h00-11h15      Coffee break 

11h15-12h45      Narrow resonance profiling basics. Straggling. (Ian Vickridge, Paris)      

12h45-14h00      Lunch 

14h00-15h00      Lecture : Magnetic detectors (Thomas J. Pollock, NEC)

15h00-16h00      Lecture : Electostatic detectors (Paul Bailey, Daresbury) 

16h00-16h15      Coffee. 

16h15-18h15      Narrow resonance profiling experiment 

Sunday 26 June (Cordeliers site (HRDP6))

9h30-12h00         Interpretation of experimental results from Saturday, with coffee break (Paris Team) 

12h00-13h30      Lunch 

13h30-14h30      Surface structure determination with MEIS (Phil Woodruff, Warwick)

14h30-15h30      Limts to depth resolution with standard RBS (Lecturer to be decided)

15h30-16h30      High resolution ERDA (Andreas Bergmaier, Munich) 

18h30                Join HRDP6 Cocktails

Tutorial 4: Live cell micro irradiation, 20/21 July 2012, Lisbon, Portugal