Tutorials for young scientists (1 per year)
The tutorials covered the main areas of application : ion implatnation, ion beam surface analysis, biomedical applications and instrumental aspects.
Surrey has held a training course for its early stage reserachers every two years and the course programme, together with the lecture notes from each of the modules can be found here
Technician Exchange Programme ( Surrey, Rossendorf, Paris and Lueven, 2010-2013)
Funding is no longer available for technicians to visit one of the larger TNA providers (SUR, HZDR, CEA and KUL) for training puposes. The aim of this programme was to share best practice on pracical and technical aspects of accelerator facilities. For more information, contact Brian Jones (email@example.com)
User Training at the TNA providers (ongoing)
Each TNA provider will provide training from experienced scientists and operators. To see Surrey's training manual, click here. If you would like to share the manual from your own insitution, please contact the Network Facilitator, Brian Jones (firstname.lastname@example.org)
Gas Detector Workshop at ETHZ
A workshop was held at ETHZ from November 3 to November 12, 2009 with participants from RBI, KUL and ETHZ. The aim of the event was to teach the participants the basic functional principles, the constructional details, and the practical use of gas ionization counters. Before the workshop, a complete set of components of an annular gas ionization chamber had been prepared. During the workshop, the detector was then assembled from scratch with these prefabricated parts. Towards the end of the tutorial, the detector was connected to the NEC SDH1 accelerator and tested in direct beam with protons and oxygen ions. For the workshop a complete documentation of the gas detector including construction blueprints, detailed assembly instructions and an operating manual has been compiled and can be found under the following link:
This kind of training worksop can be repeated with other participants, if required.
SPIRIT Networking and Leadership Course 14-18 June 2010, Surrey, UK
The SPIRIT Netwoking course took place from 1pm on Monday 14th June to 1pm on Friday 18th June.
This networking training week was designed to enable the postdoctoral fellows working on SPIRIT to conduct their reserach more effectively, to communicate their ideas and to facilitate dissemination of reserach. The course will consist of short lectures followed by exercises to develop "learning through experience". The following skills were taught :
- carrying out work in parallel
- meeting deadlines
Participants of the tutorials in front of the HZDR
Slides of the presentations will be posted here, as they are available.
|Monday, Dec 13th|
|10:00||Fundamentals I: Stopping & ranges||Wolfhard Möller||[PDF]|
|10:45||Fundamentals II: Damage & sputtering||Wolfhard Möller||[PDF]|
|12:30||Fundamentals III: Computer simulation||Wolfhard Möller||[PDF]|
|13:15||Ion sources & accelerators||Shavkat Akhmadaliev|
|14:30||Focused ion beams||Lothar Bischoff||[PDF]|
|15:15||Surface nanopatterning||Stefan Facsko|
|Tuesday, Dec 14th|
|9:00||"Semiconductors: Doping & annealing"||Wolfgang Skorupa|
|10:15||Plasma Immersion Ion Implantation||Dietmar Henke|
|11:00||Mechanical applications||Andreas Kolitsch||[PDF]|
|12:45||Semiconductors: High energy implantation||Johannes von Borany||[PDF]|
|13:30||Nanostructures and phase formation||Bernd Schmidt||[PDF]|
|14:15||Ion-assisted thin film deposition||Gintautas Abrasonis|
|15:30||Practical exercises: computer simulation / Guided tour through the ion beam centre|
The second SPIRIT Tutorial “Ion Beam Surface Analysis” was held June 20/21 at ETH Zurich. 22 participants attended the course, 9 of which obtained financial support by SPIRIT and 5 came from SPIRIT partner institutions. On the first day, 7 lectures on the basic principles of Ion Beam Analysis were held by the ETHZ team. Then samples were prepared for the RBS/PIXE measurement planned for the following day. All participants and the ETHZ team spent the evening in downtown Zurich to stimulate social contact among the young people from 13 nations. In the morning of the second day, participants formed 4 groups and carried out RBS/PIXE experiments at the accelerator lab, partly on a collection of standard samples, partly on samples of their own research projects. The laboratory work alternated with a practical course in SRIM calculation. The RBS/PIXE data taken in the morning were then analysed by the participants in the afternoon with support of the local team. All attendees were strongly motivated by the challenge of solving the given tasks. Many of them even skipped the afternoon coffee break to finish their analysis.
At the end of the tutorial, participants were asked to fill in detailed feedback forms, evaluating the quality of the tutorial administration and performance as well as the level and benefit of the lectures and the hands-on work. On the average the quality of the event was rated with 4.5 points in a range from 1 to 5 points. For a large majority of participants the level of the presented material was "just right". Of all aspects of the course the practical work was judged most positively.
This tutorial covered the basic principles of MeV ion beam analysis. Participants were introduced to RBS (Rutherford Backscattering Spectrometry), ERDA (Elastic Recoil Detection Analysis) and PIXE (Particle Induced X-ray Emission) for surface and thin layer analysis. It included hands-on laboratory practice and data analysis.
The tutorial targeted potential users of ion beam analysis techniques in a wide range of research disciplines and young students in ion beam physics. It was open to the European research community.
|Monday, Jun 20th|
|09:15||Introduction to Ion Beam Physics||Hans-Arno Synal|
|09:30||Analysis techniques I: RBS||Max Doebeli|
|10:30||Theory: Energy loss||Arnold Mueller|
|11:15||Instrumentation I: Accelerators||Hans-Arno Synal|
|13:45||Analysis techniques II: ERDA||Max Doebeli|
|14:30||Instrumentation II: Detectors||Arnold Mueller|
|15:30||Analysis techniques III: PIXE||Marius Simon|
|16:15||Hands-on I: Sample preparation||Team|
|Tuesday, June 21st|
|9:00||Hands-on II: RBS/PIXE measurement||Team|
|11:00||Hands-on II: RBS/PIXE measurement, ct'd||Team|
|13:45||Software: RBS-Analysis codes||Max Doebeli|
|14:15||Hands-on III: Data analysis||Team|
|15:45||Hands-on III: Data analysis, ct'd||Team|
A SPIRIT Tutorial of two days and a SPIRIT Workshop on High Resolution Depth Profiling were held at the Université de Pierre et Marie Curie in Paris from June 25 to June 30, 2011.
The Tutorial was held over the weekend preceding the High Resolution Depth Profiling workshop HRDP6. The Tutorial attracted 27 participants from SPIRIT and other European labs, but also from Russia, the Ukraine, South Africa, Romania, and Japan. SPIRIT was able to offer travel and accommodation bursaries to 15 participants. The placing of the Tutorial immediately before HRDP meant that it was easy to attract high-level international experts already coming to HRDP6, to give lectures on high energy resolution ion beam production, high resolution electrostatic and magnetic detectors, and applications of MEIS and high resolution ERDA. The tutorial included a hands-on session on the SAFIR narrow resonance profiling system, with a two-hour experimental session for each of three groups of ten participants, and a communal 2 1/2 hour data interpretation session. The participants appreciated the chance to meet the high level experts, and were invited to the opening cocktails of HRDP6 where they appreciated the opportunity to meet many more experts in high resolution depth profiling. Some of the Tutorial participants stayed in for the HRDP6 Workshop.
HRDP6 was attended by 74 registered participants coming from North America, South America, Asia, and Europe. Twelve Invited Speakers introduced sessions in which 34 Oral presentations were made, and 24 Poster presentations were displayed for the duration of the Workshop. The Invited Speakers, being at the cutting edge of their respective fields, were offered one of a limited series of hand-made ‘Laguiole’ pockets knives in appreciation of their contributions. A special effort was made to showcase high resolution ion beam depth profiling techniques and applications, and at the same time a selection of new or complementary high resolution depth profiling techniques were presented. In particular, there was an Invited talk on the Atom Probe, and one on the use of surface diffraction of grazing incidence He beams for monitoring MBE layer-by-layer growth – a kind of ion beam analogue of RHEED. The latest developments in high depth resolution SIMS were also presented in an Invited talk. Participants were able to relax and ‘network’ during the outings organised in central Paris, and during the Gala Dinner, which was held on a Bateau Mouche dinner cruise along the Seine River.
This third Spirit Tutorial followed on rapidly from the second Spirit Tutorial held in Zurich 20/21 June 2011. Participants coming from a long distance could include the two tutorials in a single voyage. The tutorial also preceded HRDP6, the 6th International Workshop on High Resolution Depth Profiling (this is the 2nd SPIRIT Workshop).
The Tutorial, aimed at early career researchers and at established researchers wishing to learn more about high resolution depth profiling techniques, provided lectures on basic pulse height spectroscopy, narrow resonance profiling, high resolution magnetic and electrostatic detectors, surface structure determination with MEIS, high resolution standard RBS, and high resolution ERDA. A hands-on session involving a Narrow Resonance Profiling measurement with the SAFIR facility and analysis of the obtained data was given.
Because the Tutorial immediately preceded HRDP6, a number of lectures were given by eminent scientists present in Paris for HRDP6, and participation in the Tutorial gave a good buildup for those wishing to extend their stay by participation in the scientific sessions of HRDP6.
Saturday 25 June (Jussieu Campus)
9h30-11h00 Basic particle detection instrumentation (Alain L’Hoir, Paris)
11h00-11h15 Coffee break
11h15-12h45 Narrow resonance profiling basics. Straggling. (Ian Vickridge, Paris)
14h00-15h00 Lecture : Magnetic detectors (Thomas J. Pollock, NEC)
15h00-16h00 Lecture : Electostatic detectors (Paul Bailey, Daresbury)
16h15-18h15 Narrow resonance profiling experiment
Sunday 26 June (Cordeliers site (HRDP6))
9h30-12h00 Interpretation of experimental results from Saturday, with coffee break (Paris Team)
13h30-14h30 Surface structure determination with MEIS (Phil Woodruff, Warwick)
14h30-15h30 Limts to depth resolution with standard RBS (Lecturer to be decided)
15h30-16h30 High resolution ERDA (Andreas Bergmaier, Munich)
18h30 Join HRDP6 Cocktails
A SPIRIT Tutorial of two days was held at the International Conference on Nuclear Microprobe Technology & Applications, Lisbon (ICNMTA 2012). It was organised by the UNIBW München, Institut für Messtechnik, Prof. G. Dollinger and the Université Bordeaux, CENBG, Prof. Ph. Moretto.
Preceding the 25th ICNMTA 2012 in Lisbon 30 participants from 10 nations (23 from Europe) attended the SPIRIT-Tutorial on “Live Cell Micro Irradiation”. 3 obtained financial support by SPIRIT and 16 came from SPIRIT partner institutions.
In the two days of the course 14 lectures were held by 8 speakers from the “Universität der Bundeswehr” in Munich, the University of Bordeaux and the hospital “Rechts der Isar” in Munich. The topics covered the wide range from accelerator physics via magnetical focusing and optical microscopy to the biological basics like double-strand breaks and challenges in cell handling or staining.
During the coffee and lunch breaks the attendees were able to discuss their further ideas and plans or only to report their experiences in Lisbon.
According to the participants they had learned a lot, beginning from the basics up to more advanced methods, and gave throughout positive response. Also the speakers enjoyed the pleasant atmosphere due to the strongly interested audience.
Date: 20. – 21.07.2012
Place: Lisbon, Protugal
9:00 G. Dollinger Microirradiation of cells, tissue animals, patients: a general overview
10:00 S. Girst Interaction of ions with biological matter 11:00 Coffee break
11:30 S. Incerti Monte Carlo simulation of track structure in voxellized cellular phantom for micrdosimetry in radiation biology
14:00 V. Hable What do we need to perform microirradiation of living cells and tissue? 15:00 G. Dollinger Ion sources, accelerators, phase space volume of a beam and its transformation, beam transport, pulsed beams
16:00 Coffee break
16:30 C. Greubel Focusing of ions, magnetic lenses, aberrations and their corrections
17:30 C. Greubel Single ion preparation and irradiation, targeting and scanning 2
09:00 V. Hable Conditions for cell irradiation: exit window, cell culture at beam, vertical versus horizontal beam 10:00 T. Schmid Cell and tissue handling, preparation, immuno staining, GFP-tagging
11:00 Coffee break
11:30 V. Hable Online optical microscopy for targeting and observation
14:00 Ph. Barberet – F. Vianna Beam calibration/Cell recognition/Cell targeting 15:00 T. Schmid DNA Repair
16:00 Coffee break
16:30 H. Seznec – S. Bourret Microirradiation: From cells to multicellular specimens
17:30 G. Dollinger and others What do we need in future: improvements in microbeams, cell handling, optical microscopy to improve quality of actual and new experiments