support of public and industrial
research using ion beam technology

New fields

Joint Research Activities

High-resolution X-ray spectrometer of JSI
High-resolution X-ray spectrometer of JSI

This work package will attempt to provide a new dimension to the ion beam analysis capabilities. Ion Beam analysis has been developed over the years to provide detailed 2D elemental maps of materials. Traditionally beams have been a few microns in diameter setting the resolution of these maps. Recently 3D elemental tomographic maps have been added to the analysis arsenal and using the beam to view samples in transmission has yielded interesting stopping contrast maps. Just coming on line are new nanometer resolution beams which will give greater mapping precision.
The work package is broken down into two key tasks. 3D Analysis will be led by JSI as they already have experience of developing ion tomography systems. This task will enhance the analysis of 3 dimensional structures. The second key task Chemical and Molecular Imaging, led by SUR, will explore new ways of extracting chemical and/or molecular maps from complex samples.

The CEA low-temperature irradiation coupled
to an FTIR spectrometer
The CEA low-temperature irradiation coupled to an FTIR spectrometer

Key task: 3D Analysis

The objective is to develop new experimental and calculation approaches that will lead to enhanced 3D tomographic IBA techniques using ion nanobeams.

News!

Sample cryo-preparation protocol available!

The low-temperature irradiation coupled to an
FTIR spectrometer
The low-temperature irradiation coupled to an FTIR spectrometer

Technique 1: Implementation of STIM/ PIXE 3D tomography for the chemical analysis of biological or inert materials at CNRS-CENBG and SUR nano-beams

STIM (Scanning Transmission Ion Microscopy)- Tomography has shown its great potential in the last few years to be one of the most powerful techniques to image individual biological cells, minute tissue sections or inert materials like micro-composite fibres in 3D. The subtask will cover:

  • Design, construction and testing of the goniometer stage to be installed in the analysis chambers of the new nanobeam at CNRS together with the associated control software. Software development for the 3D reconstruction of data
  • The development of sample preparation techniques: for working at the individual cell scale, advanced cryo-preparation methods will be developed in order to keep the samples structure and its chemical composition as close as possible to that of the living material

Technique 2: Confocal ion beam induced X-ray spectroscopy

The application of novel X-ray polycapillary lenses in Ion Beam Analysis (IBA) is in the early phase. The aim of this subtask is to continue to develop the experimental setup at JSI and improve the software approaches for the confocal geometry using a nano-beam at the same time keeping close contact with the very fast technology improvements in X-ray lens production. The subtask will cover:

  • Integration of the best available X-ray lens with smallest available FWHM of sensing volume (JSI)
  • Exploration of the unique ability of scanning the beam, which is not available in more common confocal X-ray fluorescence, available at synchrotrons, in order to find best measuring modes for 3D X-ray tomography (JSI, RBI)
  • Development of quantification approaches for quantitative analysis with PIXE (JSI)

Key task: Chemical and Molecular Imaging

The key task aims to enhance the present analytical capability of the MeV ion beams by exploiting different aspects of MeV ion irradiation.
One of the main limiting factors in conventional Ion Beam Analysis using scattering or X-ray emission is that for the most part the analysis only provides information on the elemental composition of the material. These techniques have seldom been used to gain chemical or molecular information. This key task will attempt to develop an ability to provide both chemical and molecular maps of samples developing two new techniques.

Technique 1: Chemical Imaging

The use of high resolution detectors in PIXE has for a long time been known to give information about the chemical bonding of the elements in the sample. To date high resolution X-ray work has been limited to the use of wave length dispersive X-ray (WDX) spectrometers.

Technique 2: MeV Secondary Ion Mass Spectrometry (MeV SIMS)

SPIRIT aim to exploit previous work started in Sweden (Sundqvist BUR et al. Science, 226(1986) 696) on Particle Desorption Mass Spectrometry and the more recent work from the Secondary Ion Mass Spectrometry (J. Matsuo et al, submitted to Rapid Communications in Mass Spectrometry, 2008) to provide detailed spectroscopic fingerprinting of large molecular systems with the aim to providing detailed molecular maps.